Since the advent of Electron Back Scattering Diffraction (EBSD) a large number of characterization techniques have been introduced taking advantage of previously existent scientific concepts and gadgets. Transmission Kikuchi Diffraction (TKD), Precession Electron Diffraction TEM based (PED-TEM) and Electron Channeling Contrast Imaging (ECCI) techniques are among the most advanced ones, together with recent slowly spreading 3D versions. The advent and continuous improvement of High-Resolution EBSD, both spatial and orientational, have open a new field on characterization. Moreover, the correlation of these modern electron microscopy techniques (SEM/TEM) with atom probe tomography (APT) enables an additional extension to unravel the three-dimensional structure and composition of complex materials.
The aim is to bring together researchers with a background in electron microscopy and/or APT to discuss applications, practical aspects and future technique development to utilize the synergistic effects of both techniques. New developments pushing the limits of 3D characterization that have high potential to be used in correlative EM/APT applications are welcome. A collective analysis of pros and cons, strengths and weaknesses of Orientation Imaging Techniques and APT would contribute to the better understanding of their cross-breeding origins, capabilities and future developments. All described techniques conform a set of very powerful approaches for microstructure characterization. The topics of the current symposium includes recent developments, experience exchange on measuring and interpretation and proposal of future improvements and technique interactions. All fields of applications (biomaterials, metals, ceramics, geology, etc.) are welcome.