Nowadays, in situ/operando transmission electron microscopy (TEM) is a rapidly growing field due to the implementation of nanotechnology towards the fabrication of greatly improved, stable and more flexible TEM holders. Furthermore, data collection, analysis and recording of dynamic information is becoming increasingly faster. Recent advances include, for example, the use of microelectromechanical systems (MEMS) based chips for in situ transmission electron microscopy. The capability to perform multiple measurements while simultaneously analyzing corresponding structural, chemical or even electronic structure changes in nanomaterials or devices down to the atomic scale are opening exciting new opportunities at the forefront of modern materials science research. Phase transformations of nanoscale materials, and corresponding changes in material properties and functionalities, are critical for fundamental science and device applications.
This symposium intends to review progress on in situ (S)TEM experiments that apply heating, cooling, electrical biasing, and mechanical testing to induce and probe phase transformations of functional materials and devices at the nanoscale.